[PATCH] D110848: [TwoAddressInstruction] Fix ReplacedAllUntiedUses in processTiedPairs

[Matthias Braun via Phabricator via llvm-commits]

MatzeB added a comment.

> Yes I considered it, but I think there are advantages to both approaches. The problem with a MIR test case is that if the target changes its instruction definitions in any way, updating the MIR input is definitely a manual process.
>
> That said, I'm happy to do a MIR test instead if you still prefer it.

The other side of the medal is that the test now depends on the all the passes before to behave the same, so changes to instruction selection, calling convention modeling etc. throw off the tests.

While I may be biased here as to what is more common, I think having a unit test as targetted as possible (1 pass only) is a good principle to aim for.


Repository:
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  https://reviews.llvm.org/D110848/new/

https://reviews.llvm.org/D110848