[PATCH] Use attachLowHighPC also for compile unit DIE

[David Blaikie]

On Thu, Aug 28, 2014 at 9:42 AM, Frédéric Riss <friss at apple.com> wrote:

>
> On 28 Aug 2014, at 17:08, David Blaikie <dblaikie at gmail.com> wrote:
>
> Could you add test coverage and attach the entire patch (covering all
> source and test changes together) as a single file for review?
>
> Sure. I thought you would like the const patch split out.
>

Ah, sure - makes sense. You're welcome to commit that straight-up/now.


> Here’s the full diff with a little test.
>

Do we have existing test coverage for the subprogram case? I imagine we do
somewhere (try breaking it and see which tests fail) though it might not be
a nice/tidy as your test case. Perhaps you could add the CU coverage to the
same test case (& possibly clean it up a bit if it's not as legible as your
new case)

Also, in cases where we include essentially untouched IR straight from the
frontend, it's preferable to include the original C (or C++ or whatever)
source that was used to produce the IR, makes it a bit easier to maintain
if we then change the schema and need to update a test, understand what it
was testing, etc. See other recently added debug info tests for examples of
this.

- David
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