[flang-commits] [flang] [flang] IEEE_NEXT_AFTER, IEEE_NEXT_DOWN, IEEE_NEXT_UP, NEAREST (PR #100782)

[via flang-commits]

vdonaldson wrote:

Several lit tests failures are due to instruction order variations. I've changed some CHECK sequences to CHECK-DAG sequences to accommodate multiple orders.

https://github.com/llvm/llvm-project/pull/100782