[all-commits] [llvm/llvm-project] e06e68: [RISCV] Replace duplicate trunc-sat-clip tests wit...
Craig Topper via All-commits
all-commits at lists.llvm.org
Wed May 29 16:06:35 PDT 2024
Branch: refs/heads/main
Home: https://github.com/llvm/llvm-project
Commit: e06e680a97d28dc95d31952a0b200add75941496
https://github.com/llvm/llvm-project/commit/e06e680a97d28dc95d31952a0b200add75941496
Author: Craig Topper <craig.topper at sifive.com>
Date: 2024-05-29 (Wed, 29 May 2024)
Changed paths:
M llvm/test/CodeGen/RISCV/rvv/fixed-vectors-trunc-sat-clip.ll
M llvm/test/CodeGen/RISCV/rvv/trunc-sat-clip-sdnode.ll
Log Message:
-----------
[RISCV] Replace duplicate trunc-sat-clip tests with more interesting tests. NFC (#93737)
For each pair of types, we had 3 identical tests using umin with the
unsigned max value.
This patch replaces two of them with smin+smax cases that can be
implemented with a signed vmax followed by a vnclipu.
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