[all-commits] [llvm/llvm-project] e06e68: [RISCV] Replace duplicate trunc-sat-clip tests wit...

Craig Topper via All-commits all-commits at lists.llvm.org
Wed May 29 16:06:35 PDT 2024


  Branch: refs/heads/main
  Home:   https://github.com/llvm/llvm-project
  Commit: e06e680a97d28dc95d31952a0b200add75941496
      https://github.com/llvm/llvm-project/commit/e06e680a97d28dc95d31952a0b200add75941496
  Author: Craig Topper <craig.topper at sifive.com>
  Date:   2024-05-29 (Wed, 29 May 2024)

  Changed paths:
    M llvm/test/CodeGen/RISCV/rvv/fixed-vectors-trunc-sat-clip.ll
    M llvm/test/CodeGen/RISCV/rvv/trunc-sat-clip-sdnode.ll

  Log Message:
  -----------
  [RISCV] Replace duplicate trunc-sat-clip tests with more interesting tests. NFC (#93737)

For each pair of types, we had 3 identical tests using umin with the
unsigned max value.

This patch replaces two of them with smin+smax cases that can be
implemented with a signed vmax followed by a vnclipu.



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