[llvm] [LLVM][AArch64] Optimize sign bit tests with TST instruction for SIGN_EXTEND patterns (PR #158061)

David Green via llvm-commits llvm-commits at lists.llvm.org
Wed Sep 17 09:21:53 PDT 2025

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https://github.com/davemgreen approved this pull request.

I think this looks OK. LGTM.

https://github.com/llvm/llvm-project/pull/158061

Previous message: [llvm] [LLVM][AArch64] Optimize sign bit tests with TST instruction for SIGN_EXTEND patterns (PR #158061)
Next message: [llvm] [AMDGPU] Introduce "amdgpu-uniform-intrinsic-combine" pass to combine uniform AMDGPU lane Intrinsics. (PR #116953)
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