[PATCH] D141823: [SCEV] More precise trip multiples

Tue Jan 31 00:15:36 PST 2023

caojoshua added a comment.

In D141823#4092531 <https://reviews.llvm.org/D141823#4092531>, @mkazantsev wrote:

> I think this needs stronger test coverage. At least I want tests for all operations (either IR tests or unittests in CPP, whatever is easier) exercising corner case scenarios, such as bit width overflow with `mul`.

Agree that more test coverage is needed here. I'd like to go with nikic's suggestion to figure out the issues with trip multiples first. I think that will make testing this much easier.

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Comment at: llvm/include/llvm/Analysis/ScalarEvolution.h:971
   /// If S is guaranteed to be 0, it returns the bitwidth of S.
-  uint32_t GetMinTrailingZeros(const SCEV *S);
+  uint32_t getMinTrailingZeros(const SCEV *S);

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mkazantsev wrote:
> Separate NFC?
You're right. I'll take this out.

Repository:
  rG LLVM Github Monorepo

CHANGES SINCE LAST ACTION
  https://reviews.llvm.org/D141823/new/

https://reviews.llvm.org/D141823