[PATCH] D141197: [ELF][test] Improve AVR relocation tests

[Ben Shi via Phabricator via llvm-commits]

benshi001 added a comment.

In D141197#4033708 <https://reviews.llvm.org/D141197#4033708>, @MaskRay wrote:

> For pure test changes, I think `[test]` is more common than `[NFC]`
>
> For lld/ELF lld/test/ELF, `[ELF]` is more common. There are many lld ports with very different code and `[lld]` in my view does not provide much value. Personally I only use `[lld]` for common lld code.

I will change to `[ELF][test]` while commtting. Thanks.


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  https://reviews.llvm.org/D141197/new/

https://reviews.llvm.org/D141197