[PATCH] D115512: [NFC][SVE] Add missing tests for i32 INC/DEC patterns.

[Paul Walker via Phabricator via llvm-commits]

This revision was automatically updated to reflect the committed changes.
Closed by commit rG22370530a37f: [NFC][SVE] Add missing tests for i32 INC/DEC patterns. (authored by paulwalker-arm).

Repository:
  rG LLVM Github Monorepo

CHANGES SINCE LAST ACTION
  https://reviews.llvm.org/D115512/new/

https://reviews.llvm.org/D115512

Files:
  llvm/lib/Target/AArch64/SVEInstrFormats.td
  llvm/test/CodeGen/AArch64/sve-intrinsics-counting-elems-i32.ll

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