[PATCH] D115512: [NFC][SVE] Add missing tests for i32 INC/DEC patterns.

[Paul Walker via Phabricator via llvm-commits]

paulwalker-arm created this revision.
Herald added subscribers: ctetreau, psnobl, hiraditya, tschuett.
Herald added a reviewer: efriedma.
paulwalker-arm requested review of this revision.
Herald added a project: LLVM.
Herald added a subscriber: llvm-commits.

D111441 <https://reviews.llvm.org/D111441> included trunc isel patterns for sve_int_pred_pattern_a
but no accompanying tests. This patch adds the missing tests and
also simplifies the isel patterns that use sve_cnt_shl_imm.


Repository:
  rG LLVM Github Monorepo

https://reviews.llvm.org/D115512

Files:
  llvm/lib/Target/AArch64/SVEInstrFormats.td
  llvm/test/CodeGen/AArch64/sve-intrinsics-counting-elems-i32.ll

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