[PATCH] D60859: [SimplifyCFG] remove bogus test case; NFC

[Nikita Popov via Phabricator via llvm-commits]

nikic added a reviewer: reames.
nikic added a subscriber: reames.
nikic added a comment.

Patch doesn't seem to be against master, here's how the test looks right now: https://github.com/llvm-mirror/llvm/blob/master/test/Transforms/SimplifyCFG/switch-dead-default.ll#L160

In any case, agree that the test doesn't make sense and we should drop it. The test wants to assert that some bits are undef, but that's not what the IR does and I don't think it's even possible to do that in any meaningful way. It was added in D12497 <https://reviews.llvm.org/D12497>, so @reames might want to double check.


Repository:
  rL LLVM

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  https://reviews.llvm.org/D60859/new/

https://reviews.llvm.org/D60859