[PATCH] D31930: [XRay] [compiler-rt] Simplify FDR logging handler. [NFC]

[Dean Michael Berris via Phabricator via llvm-commits]

dberris added a comment.

Finer grained testing (unit-testing individual / combinations of internal implementations) isn't as important now compared to doing end-to-end testing. So while the status quo allows us to test the individual functions (i.e. passing a buffer queue that wasn't the thread-local buffer queue), your change makes it harder to test in a controlled environment.

I'm saying that since we don't need to actually have finer grained testing because we can do it with end-to-end testing, this change should be fine.


https://reviews.llvm.org/D31930