[PATCH] D23646: Generalize strided store pattern in interleave access pass

[Renato Golin via Phabricator via llvm-commits]

rengolin accepted this revision.
rengolin added a comment.
This revision is now accepted and ready to land.

Hi,

Sorry to keep you waiting, this completely fell out of my radar.

I think the code looks good now, just need to make sure the test is generic enough on the CHECK line (see inline comment).

cheers,
--renato



================
Comment at: test/CodeGen/AArch64/aarch64-interleaved-accesses.ll:285
+; NEON-LABEL: store_general_mask_factor4:
+; NEON: st4 { v3.2s, v4.2s, v5.2s, v6.2s }, [x0]
+; NONEON-LABEL: store_general_mask_factor4:
----------------
Please, also use:

    st4.32 {d{{\n+}}, d{{\n+}}, d{{\n+}}, d{{\n+}}}, [x0]

here.


https://reviews.llvm.org/D23646