[PATCH] D17776: Improve CHECK-NOT robustness of dllimport/dllexport tests

[Warren Ristow via llvm-commits]

wristow created this revision.
wristow added reviewers: llvm-commits, rnk, majnemer.

This change just makes some minor fixes to some dllimport/dllexport tests,
primarily to improve the robustness of CHECK-SAME interaction with CHECK-NOT.
It also fixes a few typos that made some tests ineffective.  Lastly, it
adds some minor additional tests for exporting something in bss, and for
an alias export test.  NFC

We plan to enable dllimport/dllexport support for the PS4, and these
changes are for points we noticed in our internal testing.

Can someone review, and if OK then commit this patch for me, please?

-Warren Ristow
SN Systems - Sony Computer Entertainment Group

http://reviews.llvm.org/D17776

Files:
  llvm/test/CodeGen/X86/dllexport-x86_64.ll
  llvm/test/CodeGen/X86/dllexport.ll

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