[PATCH] D52036: [Analyzer] Use diff_plist in tests, NFC

[Mikhail Maltsev via Phabricator via cfe-commits]

miyuki updated this revision to Diff 165469.
miyuki retitled this revision from "[Analyzer] Make plist tests less fragile" to "[Analyzer] Use diff_plist in tests, NFC".
miyuki edited the summary of this revision.
miyuki added a comment.

Use a different approach (suggested by Artem).


https://reviews.llvm.org/D52036

Files:
  test/Analysis/NewDelete-path-notes.cpp
  test/Analysis/conditional-path-notes.c
  test/Analysis/copypaste/plist-diagnostics-notes-as-events.cpp
  test/Analysis/copypaste/plist-diagnostics.cpp
  test/Analysis/cxx-for-range.cpp
  test/Analysis/diagnostics/deref-track-symbolic-region.c
  test/Analysis/diagnostics/report-issues-within-main-file.cpp
  test/Analysis/diagnostics/undef-value-caller.c
  test/Analysis/diagnostics/undef-value-param.c
  test/Analysis/diagnostics/undef-value-param.m
  test/Analysis/edges-new.mm
  test/Analysis/generics.m
  test/Analysis/inline-plist.c
  test/Analysis/inline-unique-reports.c
  test/Analysis/inlining/eager-reclamation-path-notes.c
  test/Analysis/inlining/eager-reclamation-path-notes.cpp
  test/Analysis/inlining/path-notes.c
  test/Analysis/inlining/path-notes.cpp
  test/Analysis/inlining/path-notes.m
  test/Analysis/method-call-path-notes.cpp
  test/Analysis/model-file.cpp
  test/Analysis/null-deref-path-notes.m
  test/Analysis/nullability-notes.m
  test/Analysis/objc-arc.m
  test/Analysis/plist-macros.cpp
  test/Analysis/plist-output-alternate.m
  test/Analysis/plist-output.m
  test/Analysis/retain-release-path-notes.m
  test/Analysis/unix-fns.c

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