[all-commits] [llvm/llvm-project] ed8d4f: [mlir][vector] Separate bitwidth specific tests ou...

[James Newling via All-commits]

  Branch: refs/heads/main
  Home:   https://github.com/llvm/llvm-project
  Commit: ed8d4fe0b1d8088bd1a4f99f77afe33f435ef668
      https://github.com/llvm/llvm-project/commit/ed8d4fe0b1d8088bd1a4f99f77afe33f435ef668
  Author: James Newling <james.newling at gmail.com>
  Date:   2025-05-01 (Thu, 01 May 2025)

  Changed paths:
    A mlir/test/Dialect/Vector/linearize-subject-to-bitwidth.mlir
    M mlir/test/Dialect/Vector/linearize.mlir

  Log Message:
  -----------
  [mlir][vector] Separate bitwidth specific tests out  (#138071)

In https://github.com/llvm/llvm-project/pull/136581 the logic pertaining
to bitwidth was removed from the patterns. This PR further factorizes
bitwidth logic out of the main test file.

The number of tests with bitwidth (in the new file added in this PR) is
now lower than before this PR. This is because this PR only tests the
bitwidth specific logic once (there was a fair amount of redundant
testing before).

I didn't do this test refactoring in
https://github.com/llvm/llvm-project/pull/136581 because I wanted to
make it clear that it was NFC by leaving the tests unchanged there



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