[all-commits] [llvm/llvm-project] 671976: [NFC][LoopVectorize] Add more simple early exit te...

[David Sherwood via All-commits]

  Branch: refs/heads/main
  Home:   https://github.com/llvm/llvm-project
  Commit: 671976ff59ac893c2e97a95860510afa5d5e9a84
      https://github.com/llvm/llvm-project/commit/671976ff59ac893c2e97a95860510afa5d5e9a84
  Author: David Sherwood <david.sherwood at arm.com>
  Date:   2024-10-17 (Thu, 17 Oct 2024)

  Changed paths:
    A llvm/test/Transforms/LoopVectorize/AArch64/simple_early_exit.ll
    M llvm/test/Transforms/LoopVectorize/simple_early_exit.ll

  Log Message:
  -----------
  [NFC][LoopVectorize] Add more simple early exit tests (#112529)

I realised we are missing tests to cover more loops with multiple early
exits - some countable and some uncountable.

I've also added a few SVE versions of the test in the AArch64 directory.
Once we can vectorise such early exit loops it's a good sanity check to
make sure they also vectorise for SVE. Also, for some of the tests I
expect there to be some divergence from the same tests in the top level
directory once we start vectorising them.



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