[all-commits] [llvm/llvm-project] 223705: [NFC][SVE] Add missing tests for i32 INC/DEC patte...

[paulwalker-arm via All-commits]

  Branch: refs/heads/main
  Home:   https://github.com/llvm/llvm-project
  Commit: 22370530a37f55e41c19ab8021ada59745111240
      https://github.com/llvm/llvm-project/commit/22370530a37f55e41c19ab8021ada59745111240
  Author: Paul Walker <paul.walker at arm.com>
  Date:   2021-12-17 (Fri, 17 Dec 2021)

  Changed paths:
    M llvm/lib/Target/AArch64/SVEInstrFormats.td
    A llvm/test/CodeGen/AArch64/sve-intrinsics-counting-elems-i32.ll

  Log Message:
  -----------
  [NFC][SVE] Add missing tests for i32 INC/DEC patterns.

D111441 included trunc isel patterns for sve_int_pred_pattern_a
but no accompanying tests. This patch adds the missing tests and
also simplifies the isel patterns that use sve_cnt_shl_imm.

Differential Revision: https://reviews.llvm.org/D115512