[all-commits] [llvm/llvm-project] 776708: [LiveDebugValues] Remove early-exit when testing r...

[Vedant Kumar via All-commits]

  Branch: refs/heads/master
  Home:   https://github.com/llvm/llvm-project
  Commit: 776708b00bddb01f91b8d44f6853770966d335a5
      https://github.com/llvm/llvm-project/commit/776708b00bddb01f91b8d44f6853770966d335a5
  Author: Vedant Kumar <vsk at apple.com>
  Date:   2020-06-01 (Mon, 01 Jun 2020)

  Changed paths:
    M llvm/lib/CodeGen/LiveDebugValues.cpp

  Log Message:
  -----------
  [LiveDebugValues] Remove early-exit when testing regmasks, NFC

In transferRegisterDef, if the instruction has a regmask attached, we'll
check if any currently used register is clobbered by the regmask.

The early exit in this scan isn't necessary, costs a set lookup, and is
almost never taken [1]. Delete it.

[1]
http://lab.llvm.org:8080/coverage/coverage-reports/coverage/Users/buildslave/jenkins/workspace/coverage/llvm-project/llvm/lib/CodeGen/LiveDebugValues.cpp.html#L1136