[PATCH] D39415: [ARMISelLowering] Better handling of NEON load/store for sequential memory regions

[Renato Golin via Phabricator via llvm-commits]

rengolin added a comment.

In https://reviews.llvm.org/D39415#914238, @evgeny777 wrote:

> I believe algorithm complexity is O(N), where N is a number of nodes in Selection DAG (it's about finding a minimum value in a list of values). You're suggesting O(N*logN), why?


I'm lost. What algorithm is O(N)? You have nested loops, the outer one is unbound, the inner one is O(N).

> Like I said before, my testing capacity is limited

How do you know your change is good for all cases the compiler will have to handle, and not just the one you care about?

> and running test suite on a single device (even popular) also doesn't provide that much of data, you probably expect.

Testing on a single device is infinitely better than not testing it at all, I hope you can see that.

> Meanwhile someone might also want to give it a try, so I updated the diff.

So you are expecting other people to test your code for you?


https://reviews.llvm.org/D39415