[all-commits] [llvm/llvm-project] d35515: [VectorCombine] adjust tests for extract-binop; NFC

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  Branch: refs/heads/master
  Home:   https://github.com/llvm/llvm-project
  Commit: d3551516ee8543bf7e50d11905c576c8cc108b16
      https://github.com/llvm/llvm-project/commit/d3551516ee8543bf7e50d11905c576c8cc108b16
  Author: Sanjay Patel <spatel at rotateright.com>
  Date:   2020-02-13 (Thu, 13 Feb 2020)

  Changed paths:
    M llvm/test/Transforms/VectorCombine/X86/extract-binop.ll

  Log Message:
  -----------
  [VectorCombine] adjust tests for extract-binop; NFC

We want the extra-use tests to be consistent with the
earlier single-use tests and be as cheap as possible
in vector form to show cost model edge cases. So use
i8 and extract from element 0 since that should be
cheap for all x86 targets.